Compact optical device achieves super-resolution imaging beyond the diffraction limit

Compact optical device achieves super-resolution imaging beyond the diffraction limit

Researchers from the University of Science and Technology of China (USTC) have unveiled a planar optical device that significantly enhances the capabilities of dark-field microscopy, achieving super-resolution imaging beyond the diffraction limit. The work was led by Prof. Zhang Douguo and has been published in the Proceedings of the National Academy of Sciences. Researchers from the University of Science and Technology of China (USTC) have unveiled a planar optical device that significantly enhances the capabilities of dark-field microscopy, achieving super-resolution imaging beyond the diffraction limit. The work was led by Prof. Zhang Douguo and has been published in the Proceedings of the National Academy of Sciences. Optics & Photonics Phys.org – latest science and technology news stories

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