An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize atomic-scale defects in hexagonal boron nitride (hBN), a two-dimensional (2D) material often dubbed “white graphene” for its remarkable properties. An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize atomic-scale defects in hexagonal boron nitride (hBN), a two-dimensional (2D) material often dubbed “white graphene” for its remarkable properties. Nanomaterials Phys.org – latest science and technology news stories
Specially designed transistors allow researchers to ‘hear’ defects in a promising nanomaterial
